In Situ Equipments

DELMIC

Integrated SEM and fluorescence microscope
Cathodoluminescence detection system

Evactron®

Remote Plasma Cleaning Devices

Kammrath & Weiss

Tensile stage and temperature stage

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NENOVISION

Scanning Probe Microscope

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EBIC acquisition - plan view of pn junction

POINT ELECTRONIC

Components and software for electron microscopy

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Alemnis

Nanomechanical test solutions

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Imina Technologies

In Situ SEM Nanoprobing

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