In Situ Heating and Electrical Biasing Holder for Electron Microscopy
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In Situ Heating and Electrical Biasing
The FUSION products revolutionize the analytical capabilities of electron microscopes by providing the ability to conduct both in situ electrical analysis and in situ heating at temperatures up to 1200 °C, while maintaining the maximum resolution of the instrument.
Download FUSION Sample Preparation Methods
Preparing FIB Lamella on FUSION E-chips
Preparing Particles on FUSION E-Chips
Preparing Nanowires on FUSION E-chips
Stable Heating and Electrical Biasing
FUSION is a product platform, available for all major microscope manufacturers and most modern TEMs and SEMs.
The FUSION products revolutionize the analytical capabilities of electron microscopes by providing the ability to conduct both in situ electrical analysis and in situ heating at temperatures up to 1200 °C, while maintaining the maximum resolution of the instrument. No other commercial solution enables real-time, dynamic thermal and electrical analysis in a fast, versatile, high-resolution and easy-to-use package.
With better resolution comes quantifiably better analysis and results. You’re developing materials that will change the world, and Protochips is developing products to help you get there.[/text_output]
Stable Heating and Electrical Biasing
FUSION is a product platform, available for all major microscope manufacturers and most modern TEMs and SEMs. All products use the same consumable Aduro E-chips allowing for correlative studies between instruments including TEM and SEM. Aduro is a very flexible and versatile tool, enabling the thermal or electrical analysis of samples by simply replacing the consumable E-chips that support the sample.
The functionality of the platform is based on the type of E-chip you choose rather than the holder. The unique membrane heater within the thermal E-chip provides extremely high thermal stability and low drift.[/text_output]
Key benefits
- Electrical and thermal analysis – A single system provides a flexible platform for research
- Direct heating of support film – Very accurate temperature control of sample
- Robust semiconductor ceramic material – Inert, ultra-high stability and low drift, capable of reaching temperatures from ambient to 1200°C in 1ms
- Consumable semiconductor specimen support devices – Disposable design eliminates cross-contamination and provides compatibility with virtually any TEM/STEM/SEM instrument
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Specifications
Fusion Specifications
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Application Notes
Correlative Analysis in the TEM and SEM (327 downloads )
Melting and Sinter Behavior of Silver Nanoparticles in the TEM (303 downloads )
In Situ Measurements of the Thermal Properties of Carbon Nanotube/Silver Nanowires (278 downloads )
Thermal Drift and Settle Times measured for Different Temperature Excursions in the TEM (293 downloads )
EDS in the TEM and SEM with Aduro (288 downloads )
Ion Beam Deposition of Tungsten Metal onto Thin Silicon Nitride Membranes (306 downloads )
PdZn Alloy Nanoparticles on ZnO Nanobelts (284 downloads )
Visualizing Temperature Evolution of Metal Nanoparticle Catalysts in High Resolution (273 downloads )
Thermal Stability Study of LAST Thermoelectric Material in the SEM (290 downloads )
Atomic Resolution Imaging at High Temperatures in the TEAM 0.5 (313 downloads )
In Situ FCC to L10 Tetragonal Phase Transition of Magnetic FePt Nanoparticles (283 downloads )
Atomic scale imaging of 2D materials (322 downloads )
Visualizing the Electrical Switching Mechanism in ZnO-Based ReRAM Devices (308 downloads )
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