1 – Increased performance

• High-resolution image acquisition is required, beyond the ability of the original SEM electronics.
• Simultaneous acquisition is needed for SE, BSE, CL, STEM, however SEM is restricted to one signal per scan
• New auto functions, including Focus, Brightness and Contrast, Stage, Gun, Vacuum, etc.

2 – Network compatibility

• Network connectivity is required for shared storage but SEM PC is outdated and no longer compatible/allowed.
• SEM screen must be viewed/shared remotely, however SEM software does not allow video capture.
• New installation requires that the SEM must be operated remotely because of space or safety restrictions.

3 – New techniques

• High-quality image acquisition is needed for complex illumination and colour composition.
• New analysis requires new detectors, such as SE, BSE, EBIC, EBAC, RCI or EDS.
• New degrees of automation are needed for large area mapping, video acquisition or surface topography.

4 – High-value attachment or workflow

• Cost of relocating or reacquiring the analytical equipment is prohibitive compared with the cost of upgrading the SEM.
• Established/certified analytical workflows must be maintained beyond the OEM service.
• Operator training and support needs to be standardised for all SEM types.

5 – Acquisition and service costs

• Extending the lifetime of existing SEM is more cost effective than acquisition of a new microscope.
• SEM return is maximised after the upgrade, as downtime is minimised.
• SEM service cost is reduced after the upgrade.

1^st stage: the acquisition upgrade

• Microsoft Windows 10 or less, with network compatibility.
• Simultaneous signal acquisition for SE, BSE, EDS, WDS, etc.
• Optional PC and display(s) or laptop.

2^nd stage: the controls upgrade

• New SEM control electronics and software.
• Complete electronics for the SEM column.
• Automatic vacuum, gun, stage, detector controls.
• New manual control panels and accessories.

3^rd  the techniques upgrade

• Atomic-number discrimination with BSE detectors.
• Topography measurements with shape-from-shadow.
• Micro-analysis with EDS detectors and mapping.
• Electrical failure analysis with EBIC and EBAC/RCI.

Optional control panels for increased speed and productivity

• SEM panel with magnification, focus, image shift, brightness, contrast, stigmatism.
• Stage panel with trackball/joystick, XYZR locks and store/recall functions.
• USB2 controlled and fully integrated with the microscope controls software.

Optional stage controller for automatic positioning and rotation

• Integrated click-and-move, rotation and large area map acquisition.
• Configurable software limits for collision avoidance.
• USB2 controlled and fully integrated with the micro-scope controls software.

Optional SE, BSE and EDS detectors for new techniques/applications

• High performance SE detector electronics.
• Standard and low-kV BSE detector and electronics.
• Practical and affordable EDS for SEM and STEM.

Optional video processor for extended imaging channels

• Channel independent controls for brightness and contrast.
• Hardware mixed output for simultaneous acquisition with SE, CL or EDS.
• USB2 controlled and fully integrated with the acquisition software.

Optional IR chamberscope for added flexibility and safety

• In situ mount for optimum orientation and view angle.
• PC display or standalone monitor.
• USB2 controlled and fully integrated with the microscope controls software.

Optional microscope monitor for events logging and preventive maintenance

• Automatic acquisition and compression of microscope operation parameters.
• 16 x 16-bit analogue signal inputs, and software API for software parameters and events.
• Live and offline viewer with PDF export.