DELMIC – Integrated Design

DELMIC BV started up in 2010, based on the idea of the SECOM platform. The SECOM platform is an idea of the Charged Particle Optics group of Delft University of Technology. At the end of 2011 the company obtained the SPARC system from the Polman group at AMOLF. Together, the SECOM and the SPARC systems enable DELMIC to cater to a broad range of researchers; from nanophotonics to life sciences.

Sample Preparation for integrated Correlative Light and Electron Microscopy (220 downloads)

SPARC

The SPARC is a high-performance cathodoluminescence detection system produced by DELMIC. The system is designed to optimally collect and detect cathodoluminescence emission, enabling fast and sensitive material characterization at the nanoscale.

JOLT

Panchromatic and RGB Cathodoluminescence (CL) intensity detection.

FAST-EM

FAST-EM is an ultra-fast automated multibeam electron microscope (EM) designed to make complex and large EM projects simple and efficient.

METEOR

Reduce transfer steps and improve sample yield with integrated cryo-CLEM.

SECOM platform

The SECOM platform combines fluorescence and electron microscopy in one device, integrating functional and structural data with revolutionary ease and efficiency.

DELPHI

Delphi is the world’s first fully integrated solution that enables fast correlative microscopy with unique overlay precision.