FUSION

In Situ Heating and Electrical Biasing Holder for Electron Microscopy

IN SITU HEATING AND ELECTRICAL BIASING

The FUSION products revolutionize the analytical capabilities of electron microscopes by providing the ability to conduct both in situ electrical analysis and in situ heating at temperatures up to 1200 °C, while maintaining the maximum resolution of the instrument.

brochure Protochips Fusion (15 downloads)

Stable Heating and Electrical Biasing

FUSION is a product platform, available for all major microscope manufacturers and most modern TEMs and SEMs.

The FUSION products revolutionize the analytical capabilities of electron microscopes by providing the ability to conduct both in situ electrical analysis and in situ heating at temperatures up to 1200 °C, while maintaining the maximum resolution of the instrument. No other commercial solution enables real-time, dynamic thermal and electrical analysis in a fast, versatile, high-resolution and easy-to-use package.

With better resolution comes quantifiably better analysis and results. You’re developing materials that will change the world, and Protochips is developing products to help you get there.

Stable Heating and Electrical Biasing

FUSION is a product platform, available for all major microscope manufacturers and most modern TEMs and SEMs. All products use the same consumable Aduro E-chips allowing for correlative studies between instruments including TEM and SEM. Aduro is a very flexible and versatile tool, enabling the thermal or electrical analysis of samples by simply replacing the consumable E-chips that support the sample.

The functionality of the platform is based on the type of E-chip you choose rather than the holder. The unique membrane heater within the thermal E-chip provides extremely high thermal stability and low drift.

Key benefits

  • Electrical and thermal analysis – A single system provides a flexible platform for research.
  • Direct heating of support film – Very accurate temperature control of sample.
  • Robust semiconductor ceramic material – Inert, ultra-high stability and low drift, capable of reaching temperatures from ambient to 1200°C in 1ms.
  • Consumable semiconductor specimen support devices – Disposable design eliminates cross-contamination and provides compatibility with virtually any TEM/STEM/SEM instrument.

This real-time video shows rapid heating and quenching of micron-sized copper-silver particles in the SEM. The video demonstrates how quickly the Protochips Aduro™ can heat and quench samples, on the order of milliseconds. Take note of the temperature display on the upper left corner of the video.

The Fusion heating and electrical biasing system is compatible with environmental electron microscopes. This real time video shows ceria (CeO2) in a reducing atmosphere of hydrogen at 1.2 Torr at 750 °C. The lattice and surface reactions can be easily seen.

Using the Protochips FUSION System in the SEM, we show Schott glass melting at ~620 °C. Its known melting point is 622 °C. This demonstrates the accuracy of the Aduro heating system.

This real-time video shows two gold nanoparticles that are on the surface of larger iron oxide particles at 900° C. At this temperature the gold is very mobile, and the two particles coalesce into one larger nanoparticle. This demonstrates the stability of the Protochips FUSION system at high temperatures. This video was taken on a JEOL ARM200F (200 kV, Cs aberration correction) at JEOL in Akishima, Japan.

This video shows gold nanoparticles at 600 °C to demonstrate the stability of the Protochips FUSION at high temperatures, as well as its ability to resolve dynamic events with sub-Angstrom resolution. The initial video was taken at 1 frame per second, and then sped up to 5 frames per second using video editing software later. The video was taken in the TEAM 0.5 microscope (FEI Titan, 300 kV, Cs aberration correction, monochromator) at Berkeley National Laboratory, Berkeley, California.