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Fischione Instruments – Préparation d’échantillons pour la microscopie électronique

Model 1040 NanoMill TEM Specimen Preparation System

The NanoMill system uses an ultra-low energy, concentrated ion beam to produce the highest quality specimens for transmission electron microscopy.

Model 1051 TEM Mill

A state-of-the-art ion milling and polishing system.
It is compact, precise, and consistently produces high-quality transmission electron microscopy (TEM) specimens with large electron transparent areas from a wide variety of materials.

Model 1061 SEM Mill

A state-of-the-art ion milling and polishing system. It is compact, precise, and consistently produces high-quality scanning electron microscopy (SEM) samples for a wide variety of applications.

Model 1070 NanoClean

Cleans specimens and holders immediately before insertion into an electron microscope; removes existing carbonaceous debris from the specimen and prevents contamination during imaging and analysis.

Model 1080 PicoMill® TEM specimen preparation system

Combines an ultra-low energy, inert gas ion source, and a scanning electron column with multiple detectors to yield optimal TEM specimens.

Model 9020 Vacuum Pumping Station

Allows for the simultaneous vacuum storage of up to five plasma-cleaned specimens and transmission electron microscope (TEM) specimen holders.