DigiView V EBSD Camera

Versatile high resolution digital camera

The DigiView is a versatile high resolution digital camera. The CCD sensor has a particularly high Quantum Efficiency (QE), peaking in the blue-green spectrum for use with an optimized phosphor screen coating resulting in higher sensitivity for electron backscatter diffraction (EBSD) applications.

Noise is significantly reduced using a single stage Peltier cooling system that does not require a cooling fan. DigiView EBSD camera is designed to serve a wide range of EBSD applications. Using the DigiView in combination with EDAX’s TEAM™ software, the camera can obtain orientation mapping data at rates up to 200 indexed patterns per second with indexing success rates of greater than 99%.

The camera can produce high resolution images up to 1392 x 1040 pixels.


  • Data collection rates up to 200 indexed patterns per second
  • High QE CCD: > 62% @ 500 nm
  • 1.4 megapixel resolution: 1392 (H) X 1040 (V)
  • 12 bit digitization
  • Dual speed readout: 20 and 40 MHz
  • High signal to noise ratio
  • Low read noise: < 8e- @ 20 MHz
  • Gigabit ethernet protocol
  • Gain control range: 35 dB fully adjustable
  • Long term exposure: Up to 15 minutes
  • No mechanical shutter
  • Input voltage 110/220 VAC 50/60 Hz
  • CE certified

Control of the DigiView is available through the software applications, with full control over the gain, black level, exposure time, and binning settings. Comprehensive image processing capability is also included for optimal image quality.

The camera uses a bellows-based insertion and retraction system for operation while under vacuum and for live-imaging for maximum vacuum and system integrity. An optional integrated Forward Scatter Detector (FSD) is also available.


    EDAX’s TEAM™ EBSD Analysis System is the most comprehensive system available for analyzing crystalline microstructures. The solution obtains crystallographic orientation, grain-boundary character, and phase-distribution information from single and polyphase crystalline materials through the collection and analysis of Electron Backscatter Diffraction (EBSD) patterns in a scanning electron microscope (SEM). TEAM™ EBSD Analysis System combines the ease of use of the TEAM™ software platform with the analytical power of OIM to provide state of the art crystal structure characterization to all users.