EDAX – Analytical Equipments
To fully understand a material, whether it is naturally occurring or man-made, the scientist often needs to determine the relationships between its physical properties, chemical composition, crystallographic structure and morphology. The seamless integration of energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD), and wavelength dispersive spectrometry (WDS) on the electron microscope allows a direct correlation between the chemical and microstructural aspects of materials.
EDS | Octane Silicon Drift Detector (SDD) Series
EDAX has introduced the new Octane Silicon Drift Detector (SDD) Series for its TEAM™ EDS Analysis Systems on electron microscopes.
EBSD | Hikari EBSD Camera Series
The Hikari EBSD Camera Series is the next generation in electron backscatter diffraction (EBSD) cameras offering outstanding performance across the complete range of EBSD applications.
EBSD | DigiView EBSD Camera
The DigiView is a versatile high resolution digital camera. The CCD sensor has a particularly high Quantum Efficiency (QE).
EBSD | Forward Scatter Detector (FSD)
The Hikari Plus / Super electron backscatter diffraction (EBSD) camera comes standard with an integrated forward scatter detector (FSD) and DigiView can be upgraded with an FSD.
WDS | Low Energy X-ray Spectrometer (LEXS)
The LEXS is a parallel beam spectrometer (PBS) employing high collection optics (HCO), which enable the spectrometer to efficiently collect X-rays from 80 eV to 2.4 keV (Be K to S K).
WDS | Transition Element X-ray Spectrometer (TEXS)
The TEXS HP is a parallel beam spectrometer (PBS) employing capillary optics (replacing the high collection optics (HCO)), which give the spectrometer an energy range from 150 eV to 10 keV (B Kα to Cu Kα).